diff --git a/tests/ADC/test_ADC.cpp b/tests/ADC/test_ADC.cpp index 9976bb0..a2336e9 100644 --- a/tests/ADC/test_ADC.cpp +++ b/tests/ADC/test_ADC.cpp @@ -2,10 +2,10 @@ * Author: Jake G * Date: 2025 * filename: test_ADC.c - * description: module_purpose + * description: Test groups for the ADC module. */ -#include "CppUTest/CommandLineTestRunner.h" +//#include "CppUTest/CommandLineTestRunner.h" #include "CppUTestExt/MockSupport.h" #include @@ -15,7 +15,7 @@ extern "C" #include "ch32v003hw.h" } -TEST_GROUP(test_ADC) +TEST_GROUP(tg_ADC) { void setup(){ @@ -27,12 +27,12 @@ TEST_GROUP(test_ADC) } }; -TEST(test_ADC, FirstTest) +TEST(tg_ADC, FirstTest) { CHECK(true); } -TEST(test_ADC, ADC_PowerOnTest) +TEST(tg_ADC, ADC_PowerOnTest) { // The ADCON bit should be high in the ADC_CTRL2 register. mock().expectOneCall("RegEdit_u32_SetBit").withPointerParameter("reg", (void *)&ADC1->CTLR2).withUnsignedIntParameter("bit_num", ADC_ADON); @@ -40,7 +40,16 @@ TEST(test_ADC, ADC_PowerOnTest) ADC_PowerOn(); } -TEST(test_ADC, ADC_SetupSetsRegisters) +TEST(tg_ADC, ADC_PowerOffTest) +{ + mock().expectOneCall("RegEdit_u32_ClearBit") + .withPointerParameter("reg", (void *)&ADC1->CTLR2) + .withUnsignedIntParameter("bit_num", ADC_ADON); + + ADC_PowerOff(); +} + +TEST(tg_ADC, ADC_SetupSetsRegisters) { // R32_GPIOD_CFGLR --> 0x40011400 // DESC: PD port configuration register low @@ -97,7 +106,7 @@ TEST(test_ADC, ADC_SetupSetsRegisters) ADC_Setup(); } -TEST(test_ADC, ADC_InitPortAPin7UsesCorrectRegisters) +TEST(tg_ADC, ADC_InitPortAPin7UsesCorrectRegisters) { /* //Check for setting the direction to input. @@ -120,7 +129,7 @@ TEST(test_ADC, ADC_InitPortAPin7UsesCorrectRegisters) ADC_Init(7); } -TEST(test_ADC, ADC_InitPortAPin0UsesCorrectRegisters) +TEST(tg_ADC, ADC_InitPortAPin0UsesCorrectRegisters) { /* //Check for setting the direction to input. @@ -144,13 +153,13 @@ TEST(test_ADC, ADC_InitPortAPin0UsesCorrectRegisters) ADC_Init(0); } -TEST(test_ADC, ADC_InitDoesNothingOnHighPinNumbers) +TEST(tg_ADC, ADC_InitDoesNothingOnHighPinNumbers) { // mock().expectNoCall("RegEdit_SetBit"); ADC_Init(8); } -TEST(test_ADC, ADC_EnablePasses) +TEST(tg_ADC, ADC_EnablePasses) { /* mock().expectOneCall("RegEdit_SetBit") @@ -161,7 +170,7 @@ TEST(test_ADC, ADC_EnablePasses) ADC_Enable(); } -TEST(test_ADC, ADC_DisablePasses) +TEST(tg_ADC, ADC_DisablePasses) { /* mock().expectOneCall("RegEdit_ClearBit") @@ -171,7 +180,7 @@ TEST(test_ADC, ADC_DisablePasses) ADC_Disable(); } -TEST(test_ADC, ADC_SetPinSetsRightRegisters) +TEST(tg_ADC, ADC_SetPinSetsRightRegisters) { /* //It clears existing MUXPOS register values. @@ -187,7 +196,7 @@ TEST(test_ADC, ADC_SetPinSetsRightRegisters) ADC_SetPin(4); } -TEST(test_ADC, ADC_SetPinFailsOnInvalidPin) +TEST(tg_ADC, ADC_SetPinFailsOnInvalidPin) { ADC_SetPin(8); } diff --git a/tests/AllTests.cpp b/tests/AllTests.cpp index f1773bd..968436c 100644 --- a/tests/AllTests.cpp +++ b/tests/AllTests.cpp @@ -2,7 +2,7 @@ // ImportTestGroups IMPORT_TEST_GROUP(simple_test); -IMPORT_TEST_GROUP(test_ADC); +IMPORT_TEST_GROUP(tg_ADC); IMPORT_TEST_GROUP(test_RegEdit); IMPORT_TEST_GROUP(test_blink);