diff --git a/tests/ADC/CMakeLists.txt b/tests/ADC/CMakeLists.txt
new file mode 100644
index 0000000..6318a53
--- /dev/null
+++ b/tests/ADC/CMakeLists.txt
@@ -0,0 +1,17 @@
+# TEST_RUNNER
+add_library(test_ADC
+    test_ADC.cpp    
+)
+
+target_link_libraries(test_ADC
+    ${CPPUTEST_LIBRARIES}/libCppUTest.a
+    ${CPPUTEST_LIBRARIES}/libCppUTestExt.a
+    ADC
+    MockRegEdit
+)
+
+#Needed for the tests to function
+include_directories(
+    /usr/local/avr/include/avr
+    #/usr/lib/avr/include/avr
+)
diff --git a/tests/ADC/test_ADC.cpp b/tests/ADC/test_ADC.cpp
new file mode 100644
index 0000000..b9abb6a
--- /dev/null
+++ b/tests/ADC/test_ADC.cpp
@@ -0,0 +1,192 @@
+/*
+ * Author: Jake G 
+ * Date: 2024 
+ * filename: test_ADC.c
+ * description: module_purpose
+ */
+
+#include "CppUTest/CommandLineTestRunner.h"
+#include "CppUTestExt/MockSupport.h"
+#include <cstdint>
+
+//This define allows us to dircetly include the device header without error.
+#define _AVR_IO_H_
+
+
+extern "C" 
+{
+#include <iotn404.h> //ATtiny404 header fille.
+#include "ADC.h"
+}
+
+TEST_GROUP(test_ADC)
+{
+    void setup()
+    {
+
+    }
+    void teardown()
+    {
+        mock().checkExpectations();
+        mock().clear();
+    }
+};
+
+TEST(test_ADC, FirstTest)
+{
+   CHECK(true);
+}
+
+
+TEST(test_ADC, ADC_SetupSetsRegisters)
+{
+    //Clears control register A for ADC0
+    mock().expectOneCall("RegEdit_SetNum")
+        .withPointerParameter("reg", (void *) &ADC0.CTRLA)
+        .withUnsignedIntParameter("num", 0x00);
+
+    //Sets The sample accumulation number to 32.
+    mock().expectOneCall("RegEdit_SetNum")
+        .withPointerParameter("reg", (void *) &ADC0.CTRLB)
+        .withUnsignedIntParameter("num", 0x5);
+
+    //Sets the voltage reference to VDD or VCC.
+    mock().expectOneCall("RegEdit_SetBit")
+        .withPointerParameter("reg", (void *) &ADC0.CTRLC)
+        .withUnsignedIntParameter("bit_num", 4);
+
+    //Sets the pre-scalar for the adc sample rate.
+    mock().expectOneCall("RegEdit_SetBit")
+        .withPointerParameter("reg", (void *) &ADC0.CTRLC)
+        .withUnsignedIntParameter("bit_num", 2);
+
+    //Setup an Initalization delay.
+    mock().expectOneCall("RegEdit_OR_Num")
+        .withPointerParameter("reg", (void *) &ADC0.CTRLD)
+        .withUnsignedIntParameter("num", (2<<5));
+
+    //Set the bit for ADC variation during readings.
+    mock().expectOneCall("RegEdit_SetBit")
+        .withPointerParameter("reg", (void *) &ADC0.CTRLD)
+        .withUnsignedIntParameter("bit_num", 4);
+
+    ADC_Setup();     
+}
+
+TEST(test_ADC, ADC_InitPortAPin7UsesCorrectRegisters)
+{
+    //Check for setting the direction to input.
+    mock().expectOneCall("RegEdit_ClearBit")
+        .withPointerParameter("reg", (void *) &PORTA.DIR)
+        .withUnsignedIntParameter("bit_num", 7);
+ 
+    //Check that the pullup is off 
+    mock().expectOneCall("RegEdit_ClearBit")
+        .withPointerParameter("reg", (void *) &PORTA.OUT)
+        .withUnsignedIntParameter("bit_num", 7);
+
+    //Set the ISC(input sense config) to disable digital input
+    //buffering and reduce the noise on ADC usage.
+    mock().expectOneCall("RegEdit_SetBit")
+        .withPointerParameter("reg", (void *) &PORTA.PIN7CTRL)
+        .withUnsignedIntParameter("bit_num", PORT_ISC_INPUT_DISABLE_gc);
+
+
+    ADC_Init(7);
+}
+
+TEST(test_ADC, ADC_InitPortAPin0UsesCorrectRegisters)
+{
+
+    //Check for setting the direction to input.
+    mock().expectOneCall("RegEdit_ClearBit")
+        .withPointerParameter("reg", (void *) &PORTA.DIR)
+        .withUnsignedIntParameter("bit_num", 0);
+ 
+    //Check that the pullup is off 
+    mock().expectOneCall("RegEdit_ClearBit")
+        .withPointerParameter("reg", (void *) &PORTA.OUT)
+        .withUnsignedIntParameter("bit_num", 0);
+
+    //Set the ISC(input sense config) to disable digital input
+    //buffering and reduce the noise on ADC usage.
+    mock().expectOneCall("RegEdit_SetBit")
+        .withPointerParameter("reg", (void *) &PORTA.PIN0CTRL)
+        .withUnsignedIntParameter("bit_num", PORT_ISC_INPUT_DISABLE_gc);
+
+
+    ADC_Init(0);
+}
+
+TEST(test_ADC, ADC_InitDoesNothingOnHighPinNumbers)
+{
+    mock().expectNoCall("RegEdit_SetBit");
+    ADC_Init(8);
+}
+
+TEST(test_ADC, ADC_EnablePasses)
+{
+
+    mock().expectOneCall("RegEdit_SetBit")
+        .withPointerParameter("reg", (void *) &ADC0.CTRLA)
+        .withUnsignedIntParameter("bit_num", 0);
+
+    ADC_Enable();
+
+}
+
+TEST(test_ADC, ADC_DisablePasses)
+{
+    mock().expectOneCall("RegEdit_ClearBit")
+        .withPointerParameter("reg", (void *) &ADC0.CTRLA)
+        .withUnsignedIntParameter("bit_num", 0);
+
+    ADC_Disable();
+}
+
+TEST(test_ADC, ADC_SetPinSetsRightRegisters)
+{
+    //It clears existing MUXPOS register values.
+    mock().expectOneCall("RegEdit_ClearRegister")
+        .withPointerParameter("reg", (void *) &ADC0.MUXPOS);
+
+    //It Correctly sets the pin number.
+    mock().expectOneCall("RegEdit_SetNum")
+        .withPointerParameter("reg", (void *) &ADC0.MUXPOS)
+        .withUnsignedIntParameter("num", 4);
+
+    ADC_SetPin(4);
+}
+
+
+TEST(test_ADC, ADC_SetPinFailsOnInvalidPin)
+{
+    ADC_SetPin(8);
+}
+
+
+static uint16_t ADC_ReadValueFake(uint8_t pin_num)
+{
+    return 512;
+}
+
+TEST_GROUP(test_ADCRead)
+{
+    void setup()
+    {
+        UT_PTR_SET(ADC_ReadValue, ADC_ReadValueFake);
+    }
+
+    void teardown()
+    {
+
+    }
+};
+
+TEST(test_ADCRead, FunctionPointerSwapWorks)
+{
+    uint16_t value = ADC_ReadValue(0);
+    
+    LONGS_EQUAL(512, value);
+}
+
diff --git a/tests/CMakeLists.txt b/tests/CMakeLists.txt
index 9a138fb..38b845d 100644
--- a/tests/CMakeLists.txt
+++ b/tests/CMakeLists.txt
@@ -4,11 +4,12 @@ project(Tests)
 add_subdirectory(Relays)
 add_subdirectory(SuperLoop)
 #add_subdirectory(timer)
-#add_subdirectory(usart)
 add_subdirectory(MockRegEdit)
 add_subdirectory(RegEdit)
 add_subdirectory(simple_test)
-
+add_subdirectory(ADC)
+add_subdirectory(MockADC)
+add_subdirectory(load)
 
 
 
diff --git a/tests/MockADC/CMakeLists.txt b/tests/MockADC/CMakeLists.txt
new file mode 100644
index 0000000..cd51613
--- /dev/null
+++ b/tests/MockADC/CMakeLists.txt
@@ -0,0 +1,10 @@
+# TEST_RUNNER
+add_library(test_MockADC
+    test_MockADC.cpp    
+)
+
+target_link_libraries(test_MockADC
+    ${CPPUTEST_LIBRARIES}/libCppUTest.a
+    ${CPPUTEST_LIBRARIES}/libCppUTestExt.a
+    MockADC
+)
diff --git a/tests/MockADC/test_MockADC.cpp b/tests/MockADC/test_MockADC.cpp
new file mode 100644
index 0000000..8b0b5ee
--- /dev/null
+++ b/tests/MockADC/test_MockADC.cpp
@@ -0,0 +1,94 @@
+/*
+ * Author: Jake G 
+ * Date: 2024 
+ * filename: test_MockADC.c
+ * description: 
+ */
+
+#include "CppUTest/CommandLineTestRunner.h"
+#include "CppUTestExt/MockSupport.h"
+#include <cstdint>
+
+extern "C" 
+{
+#include "MockADC.h"
+}
+
+TEST_GROUP(test_MockADC)
+{
+    void setup()
+    {
+
+    }
+    void teardown()
+    {
+        mock().checkExpectations();
+        mock().clear();
+    }
+};
+
+TEST(test_MockADC, ADC_InitExpects)
+{
+    mock().expectOneCall("ADC_Init")
+        .withUnsignedIntParameter("pin_num", 7);
+
+    ADC_Init(7);
+}
+
+TEST(test_MockADC, ADC_EnableExpects)
+{
+    mock().expectOneCall("ADC_Enable");
+
+    ADC_Enable();
+}
+
+
+TEST(test_MockADC, ADC_DisableExpect)
+{
+    mock().expectOneCall("ADC_Disable");
+
+    ADC_Disable();
+}
+
+TEST(test_MockADC, ADC_ReadValue)
+{
+    MockADC_ZeroIndex();
+    MockADC_PushValue(512);
+ 
+    mock().expectOneCall("ADC_ReadValue_Impl")
+        .withUnsignedIntParameter("pin_num", 0x2);
+
+    uint16_t val = ADC_ReadValue(0x2);
+    LONGS_EQUAL(512, val);
+    
+}
+
+TEST(test_MockADC, ADC_ReadValueReturnsZeroOnEmptyBuffer)
+{
+    MockADC_ZeroIndex();
+    
+    mock().expectOneCall("ADC_ReadValue_Impl")
+        .withUnsignedIntParameter("pin_num", 0x2)
+        .andReturnValue(0x0000);
+
+    uint16_t val = ADC_ReadValue(0x2);
+    LONGS_EQUAL(0, val);
+}
+
+TEST(test_MockADC, MockADC_PushValueDoesntOverflowArray)
+{
+    MockADC_ZeroIndex();
+    for(int i = 0; i < 257; i++){
+        MockADC_PushValue(512+i); 
+        CHECK_TRUE(MockADC_GetIndex() <= 255);
+    }
+}
+
+TEST(test_MockADC, MockADC_SetupSetsGlobal)
+{
+    CHECK_FALSE(MockADC_IsSetup());
+    
+    ADC_Setup();
+
+    CHECK_TRUE(MockADC_IsSetup());
+}
diff --git a/tests/load/CMakeLists.txt b/tests/load/CMakeLists.txt
new file mode 100644
index 0000000..f33cce9
--- /dev/null
+++ b/tests/load/CMakeLists.txt
@@ -0,0 +1,12 @@
+# TEST_RUNNER
+add_library(test_load
+    test_load.cpp    
+)
+
+target_link_libraries(test_load
+    ${CPPUTEST_LIBRARIES}/libCppUTest.a
+    ${CPPUTEST_LIBRARIES}/libCppUTestExt.a
+    load
+    MockADC
+    MockRegEdit
+)
diff --git a/tests/load/test_load.cpp b/tests/load/test_load.cpp
new file mode 100644
index 0000000..72fd3a9
--- /dev/null
+++ b/tests/load/test_load.cpp
@@ -0,0 +1,56 @@
+/*
+ * Author: Jake G 
+ * Date: 2024 
+ * filename: test_load.cpp
+ * description: 
+ */
+
+#include "CppUTest/CommandLineTestRunner.h"
+#include "CppUTestExt/MockSupport.h"
+#include <cstdint>
+
+
+//This define allows us to dircetly include the device header without error.
+#define _AVR_IO_H_
+
+extern "C" 
+{
+#include <iotn404.h> //ATtiny404 header fille.
+#include "load.h"
+#include "MockADC.h"
+#include "MockADC.h"
+}
+
+TEST_GROUP(test_load)
+{
+    void setup()
+    {
+
+    }
+    void teardown()
+    {
+        mock().checkExpectations();
+        mock().clear();
+    }
+};
+
+TEST(test_load, LoadPass)
+{
+    CHECK_TRUE(true);
+}
+
+TEST(test_load, PortAHandlerSuccess)
+{
+    mock().expectOneCall("ADC_Init")
+        .withUnsignedIntParameter("pin_num", 4);
+
+    mock().expectOneCall("ADC_Enable");
+    mock().expectOneCall("ADC_ReadValue_Impl")
+        .withUnsignedIntParameter("pin_num", 4);
+    mock().expectOneCall("ADC_Disable");
+    mock().expectOneCall("RegEdit_ClearBit")
+        .withPointerParameter("reg", (void *) &PORTA.OUT)
+        .withUnsignedIntParameter("bit_num", 7);
+    
+    Load_HandleLoadPortA(4, 7);
+}