Test/tests/ADC/test_ADC.cpp

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/*
* Author: Jake G
* Date: 2024
* filename: test_ADC.c
* description: module_purpose
*/
#include "CppUTest/CommandLineTestRunner.h"
#include "CppUTestExt/MockSupport.h"
#include <cstdint>
//This define allows us to dircetly include the device header without error.
#define _AVR_IO_H_
extern "C"
{
#include <iotn404.h> //ATtiny404 header fille.
#include "ADC.h"
}
TEST_GROUP(test_ADC)
{
void setup()
{
}
void teardown()
{
mock().checkExpectations();
mock().clear();
}
};
TEST(test_ADC, FirstTest)
{
CHECK(true);
}
TEST(test_ADC, ADC_InitPortAPin7UsesCorrectRegisters)
{
//Check for setting the direction to input.
mock().expectOneCall("RegEdit_SetBit")
.withPointerParameter("reg", (void *) &PORTA.DIRCLR)
.withUnsignedIntParameter("bit_num", 7);
//Check that the pullup is off
mock().expectOneCall("RegEdit_SetBit")
.withPointerParameter("reg", (void *) &PORTA.OUTCLR)
.withUnsignedIntParameter("bit_num", 7);
//Set the ISC(input sense config) to disable digital input
//buffering and reduce the noise on ADC usage.
mock().expectOneCall("RegEdit_OR_Num")
.withPointerParameter("reg", (void *) &PORTA.PIN7CTRL)
.withUnsignedIntParameter("num", 0x4);
//check that the resolusion is selected
mock().expectOneCall("RegEdit_ClearBit")
.withPointerParameter("reg", (void *) &ADC0.CTRLA)
.withUnsignedIntParameter("bit_num", 2);
//check for the seleceted refernce voltage
//we leave the adc prescaler alone mostly.
mock().expectOneCall("RegEdit_SetBit")
.withPointerParameter("reg", (void *) &ADC0.CTRLC)
.withUnsignedIntParameter("bit_num", 4);
ADC_Init(7);
}
TEST(test_ADC, ADC_InitPortAPin0UsesCorrectRegisters)
{
//Check for setting the direction to input.
mock().expectOneCall("RegEdit_SetBit")
.withPointerParameter("reg", (void *) &PORTA.DIRCLR)
.withUnsignedIntParameter("bit_num", 0);
//Check that the pullup is off
mock().expectOneCall("RegEdit_SetBit")
.withPointerParameter("reg", (void *) &PORTA.OUTCLR)
.withUnsignedIntParameter("bit_num", 0);
//Set the ISC(input sense config) to disable digital input
//buffering and reduce the noise on ADC usage.
mock().expectOneCall("RegEdit_OR_Num")
.withPointerParameter("reg", (void *) &PORTA.PIN0CTRL)
.withUnsignedIntParameter("num", 0x4);
//check that the resolusion is selected
mock().expectOneCall("RegEdit_ClearBit")
.withPointerParameter("reg", (void *) &ADC0.CTRLA)
.withUnsignedIntParameter("bit_num", 2);
//check for the seleceted refernce voltage
//we leave the adc prescaler alone mostly.
mock().expectOneCall("RegEdit_SetBit")
.withPointerParameter("reg", (void *) &ADC0.CTRLC)
.withUnsignedIntParameter("bit_num", 4);
ADC_Init(0);
}
TEST(test_ADC, ADC_InitDoesNothingOnHighPinNumbers)
{
mock().expectNoCall("RegEdit_SetBit");
ADC_Init(8);
}
TEST(test_ADC, ADC_EnableSuccessOnPin7)
{
//Set the MUXPOS or the ADC pin stuff.
mock().expectOneCall("RegEdit_OR_Num")
.withPointerParameter("reg", (void *) &ADC0.MUXPOS)
.withUnsignedIntParameter("num", ADC_MUXPOS_AIN7_gc);
mock().expectOneCall("RegEdit_SetBit")
.withPointerParameter("reg", (void *) &ADC0.CTRLA)
.withUnsignedIntParameter("bit_num", 0);
ADC_Enable(7);
}
TEST(test_ADC, ADC_EnableNothingOnHighPinNumbers)
{
mock().expectNoCall("RegEdit_SetBit");
ADC_Enable(8);
}
TEST(test_ADC, ADC_DisablePasses)
{
//Clears the muxpos register
mock().expectOneCall("RegEdit_ClearRegister")
.withPointerParameter("reg", (void *) &ADC0.MUXPOS);
mock().expectOneCall("RegEdit_ClearBit")
.withPointerParameter("reg", (void *) &ADC0.CTRLA)
.withUnsignedIntParameter("bit_num", 0);
ADC_Disable();
}
static uint16_t ADC_ReadValueFake(uint8_t pin_num)
{
return 512;
}
TEST_GROUP(test_ADCRead)
{
void setup()
{
UT_PTR_SET(ADC_ReadValue, ADC_ReadValueFake);
}
void teardown()
{
}
};
TEST(test_ADCRead, FunctionPointerSwapWorks)
{
uint16_t value = ADC_ReadValue(0);
LONGS_EQUAL(512, value);
}